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NXP Semiconductors
10.4 I/O pins
Table 12. Dynamic characteristic: I/O pins [1]
T amb = ? 40 ° C to +85 ° C; 1.8 V ≤ V DD ≤ 3.6 V.
LPC11C12/C14
Symbol
t r
Parameter
rise time
Conditions
pin
Min
3.0
Typ
-
Max
5.0
Unit
ns
configured as
output
t f
fall time
pin
2.5
-
5.0
ns
configured as
output
[1]
Applies to standard port pins and RESET pin.
10.5 I 2 C-bus
Table 13. Dynamic characteristic: I 2 C-bus pins [1]
T amb = ? 40 ° C to +85 ° C. [2]
Symbol
f SCL
Parameter
SCL clock
frequency
Conditions
Standard-mode
Fast-mode
Fast-mode Plus
Min
0
0
0
Max
100
400
1
Unit
kHz
kHz
MHz
t f
fall time
[4][5][6][7]
of both SDA and
-
300
ns
SCL signals
Standard-mode
Fast-mode
Fast-mode Plus
20 + 0.1 × C b
-
300
120
ns
ns
t LOW
t HIGH
LOW period of
the SCL clock
HIGH period of
the SCL clock
Standard-mode
Fast-mode
Fast-mode Plus
Standard-mode
Fast-mode
Fast-mode Plus
4.7
1.3
0.5
4.0
0.6
0.26
-
-
-
-
-
-
μ s
μ s
μ s
μ s
μ s
μ s
t HD;DAT
data hold time
[3][4][8]
Standard-mode
0
-
μ s
Fast-mode
Fast-mode Plus
0
0
-
-
μ s
μ s
t SU;DAT
data set-up
time
[9][10]
Standard-mode
Fast-mode
250
100
-
-
ns
ns
Fast-mode Plus
50
-
ns
[1]
[2]
[3]
[4]
[5]
See the I 2 C-bus specification UM10204 for details.
Parameters are valid over operating temperature range unless otherwise specified.
t HD;DAT is the data hold time that is measured from the falling edge of SCL; applies to data in transmission
and the acknowledge.
A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the
V IH (min) of the SCL signal) to bridge the undefined region of the falling edge of SCL.
C b = total capacitance of one bus line in pF.
LPC11C12_C14_0
Preliminary data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 00.05 — 23 April 2010
? NXP B.V. 2010. All rights reserved.
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